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      電壓擊穿試驗(yàn)儀美標(biāo)標(biāo)準(zhǔn)ASTM D149

      電壓擊穿試驗(yàn)儀美標(biāo)標(biāo)準(zhǔn)ASTM D149

      日期:2025-12-04 20:37
      瀏覽次數(shù):2068
      摘要:

      電壓擊穿試驗(yàn)儀美標(biāo)標(biāo)準(zhǔn)ASTM D149
      Designation: D 149 – 97a(Reapproved 2004)
      Standard Test Method for
      Dielectric Breakdown Voltage
      nd Dielectric Strength of
      Solid Electrical Insulating Materials at Commercial Power
      1
      Frequencies
      This standard is issued under the fixed designation D 149; thenumber immediately following the designation indicates the yearof
      original adoption or, in the case of revision, the year of lastrevision. A number in parentheses indicates the year of lastreapproval. A
      superscript epsilon (e) indicates an editorial change since thelast revision or reapproval.
      This standard has been approved for use by agencies of theDepartment of Defense.
      1. Scope over). With the addition of instructions modifying Section12,
      this test method may be used for proof testing.
      1.1 This test method covers procedures for the determina-
      1.8 ThistestmethodissimilartoIECPublication243-1.All
      tion of dielectric strength of solid insulating materials at
      2,3 procedures in this method are included in IEC 243-1.Differ-
      commercial power frequencies, under specified conditions.
      ences between this methodand IEC 243-1 are largely editorial.
      1.2 Unless otherwise specified, the tests shall be made at 60
      1.9 This standard does not purport to address all of the
      Hz. However, this test method may be used at any frequency
      safety concerns, if any, associated with its use. It is the
      from 25 to 800 Hz. At frequencies above 800 Hz, dielectric
      responsibility of the user of this standard to establish appro-
      heating may be a problem.
      電壓擊穿試驗(yàn)儀美標(biāo)標(biāo)準(zhǔn)ASTM D149

      priate safety
      nd health practices
      nd determine theapplica-
      1.3 This test method is intended to be used in conjunction
      bility of regulatory limitations prior to use. Specific hazard
      with anyASTM standard or other document that refers to this
      statements are given in Section 7. Alsosee
      6.4.1.
      test method. References to this document should specify the
      particular options to be used (see 5.5).
      2. Referenced Documents
      1.4 It may be used at various temperatures,
      nd in any
      4
      2.1 ASTM Standards:
      suitable gaseous or liquid surrounding medium.
      D 374 Test Methods for Thickness of Solid Electrical Insu-
      1.5 This test method is not intended for measuring the
      lation
      dielectric strength of materials that are fluid under thecondi-
      D 618 Practice for Conditioning Plastics for Testing
      tions of test.
      D 877 Test Method for Dielectric Breakdown Voltage of
      1.6 This test method is not intended for use in determining
      Insulating Liquids Using Disk Electrodes
      intrinsic dielectric strength, direct-voltage dielectricstrength,
      D 1711 Terminology Relating to Electrical Insulation
      or thermal failure under electrical stress (see Test Method
      D 2413 Practice for Preparation of Insulating Paper and
      D3151).
      Board Impregnated with a Liquid Dielectric
      1.7 This test method is most commonly used to determine
      D 3151 Test Method forThermal Failure of Solid Electrical
      thedielectricbreakdownvoltagethroughthethicknessofatest
      Insulating Materials Under Electric Stress
      specimen (puncture). It may also be used to determine dielec-
      D 3487 Specification for Mineral Insulating Oil Used in
      tric breakdown voltage along the interface between a solid
      Electrical Apparatus
      specimen
      nd agaseous or liquid surrounding medium (flash-
      D 5423 Specification for Forced-Convection Laboratory
      Ovens for Electrical Insulation
      電壓擊穿試驗(yàn)儀美標(biāo)標(biāo)準(zhǔn)ASTM D149
      1
      This test method is under the jurisdiction of ASTM Committee D09 on2.2 IEC Standard:
      Electrical
      nd Electronic InsulatingMaterials
      nd isthe direct responsibility of
      Pub. 243-1 Methods of Test for Electrical Strength of Solid
      Subcommittee D09.12 on Electrical Tests. 5
      Insulating Materials—Part 1: Tests at Power Frequencies
      Current edition approved March 1, 2004. Published March 2004.Originally
      approved in 1922. Last previous edition approved in 1997 as D149–
      97a.
      2
      Bartnikas, R., Chapter 3, “High Voltage Measurements," ElectricalProperties
      4
      of Solid Insulating Materials, Measurement Techniques, Vol. IIB,Engineering For referenced ASTM standards, visit the ASTMwebsite,
      www.astm.org, or
      Dielectrics, R. Bartnikas, Editor, ASTM STP 926, ASTM,Philadelphia, 1987. contact ASTM Customer Service at
      service@astm.org
      . For Annual Book of ASTM
      3
      Nelson, J. K., Chapter 5, “Dielectric Breakdown of Solids,"Electrical Standards volume information, refer to the standard’sDocument Summary page on
      Properties of Solid Insulating Materials: MolecularStructure
      nd Electrical the ASTM website.
      5
      Behavior, Vol. IIA, Engineering Dielectrics, R. Bartnikas
      nd R. M. Eichorn,Available from the International Electrotechnical Commission,Geneva, Swit-
      Editors, ASTM STP 783, ASTM, Philadelphia, 1983. zerland.
      Copyright (C) ASTM International, 100 Barr Harbor Drive, PO BoxC700, West Conshohocken, PA 19428-2959, UnitedStates.

      D 149 –97a (2004)
      2.3 ANSI Standard:environmentalsituations.Thistestmethodisusefulforprocess
      C68.1 Techniques for Dielectric Tests, IEEE Standard No. control,acceptance or research testing.
      6
      4 5.3 Resultsobtainedbythistestmethodcanseldombeused
      directly to determine the dielectric behavior of a material inan
      3. Terminology actual application. In most cases it is necessarythat these
      results be evaluated by comparison with results obtained from
      3.1 Definitions:
      other functional tests or from tests on other materials, orboth,
      3.1.1
      dielectric breakdown voltage(electric breakdown
      in order to estimate their significance for a particularmaterial.
      voltage), n—the potential difference at which dielectricfailure
      5.4 Three methods for voltage application are specified in
      occurs under prescribed conditions in an electrical insulating
      Section 12: Method A, Short-Time Test; Method B, Step-by-
      material located between two electrodes. (See also Appendix
      StepTest;
      nd Method C, Slow Rate-of-RiseTest. MethodAis
      X1.)
      the most commonly-used test for quality-control tests. How-
      3.1.1.1 Discussion—The term dielectric breakdown voltage
      ever, the longer-time tests, Methods B
      nd C, which usually
      is sometimes shortened to “breakdown voltage."
      will give lower test results, may give more meaningful results
      3.1.2 dielectric failure (under test), n—an event that is
      whendifferentmaterialsarebeingcomparedwitheachother.If
      evidencedbyanincreaseinconductanceinthedielectricunder
      a test set with motor-driven voltage control is available, the
      test limiting the electric field that can be sustained.
      slow rate-of-rise test is simpler
      nd preferable to the step-by-
      3.1.3 dielectric strength, n—the voltage gradient at which
      step test. The results obtained from Methods B
      nd C are
      dielectric failure of the insulating material occurs under spe-
      comparable to each other.
      cific conditions of test.
      5.5 Documents specifying the use of this test method shall
      3.1.4 electric strength, n—see dielectric strength.
      also specify:
      3.1.4.1 Discussion—Internationally, “electric strength" is
      5.5.1 Method of voltage application,
      used almost universally.
      5.5.2 Voltage rate-of-rise, if slow rate-of-rise method is
      3.1.5 flashover, n—a disruptive electrical discharge at the
      specified,
      surface of electrical insulation or in the surrounding medium,
      5.5.3 Specimen selection, preparation,
      nd conditioning,
      which may or may not cause permanent damage to the
      5.5.4 Surrounding medium
      nd temperature during test,
      insulation.
      電壓擊穿試驗(yàn)儀美標(biāo)標(biāo)準(zhǔn)ASTM D149

      5.5.5 Electrodes,
      3.1.6 For definitions of other terms relating to solid insulat-
      5.5.6 Wherever possible, the failure criterion of the current-
      ing materials, refer to Terminology D 1711.
      sensing element, and
      4. Summary of Test Method 5.5.7 Any desired deviations from therecommended proce-
      dures as given.
      4.1 Alternating voltage at a commercial power frequency
      5.6 If any of the requirements listed in 5.5 are missing from
      (60 Hz, unless otherwise specified) is applied to a test
      the specifying document, then the recommendations for the
      specimen. The voltage is increased from zero or from a level
      several variables shall be followed.
      well below the breakdown voltage, in one of three prescribed
      5.7 Unless the items listed in 5.5 are specified, tests made
      methods of voltage application, until dielectric failure of the
      with such inadequate reference to this test method are not in
      test specimen occurs.
      conformancewiththistestmethod.Iftheitemslistedin5.5are
      4.2 Mostcommonly,thetestvoltageisappliedusingsimple
      not closely controlled during the test, the precisions statedin
      test electrodes on opposite faces of specimens. The specimens
      15.2
      nd 15.3 maynot be realized.
      may be molded or cast, or cut from flat sheet or plate. Other
      5.8 Variations in the failure criteria (current setting and
      electrode
      ndspecimen configurations may be used to accom-
      response time) of the current sensing element significantly
      modate the geometry of the sample material, or to simulate a
      affect the test results.
      specific application for which the material is being evaluated.
      5.9 Appendix X1. contains a more complete discussion of
      the significance of dielectric strength tests.
      5. Significance
      nd Use
      5.1 The dielectric strength of an electrical insulating mate- 6.Apparatus
      rial is a property of interest for any application where an
      6.1 Voltage Source—Obtain the test voltage from a step-up
      electrical field will be present. In many cases the dielectric
      transformer supplied from a variable sinusoidal low-voltage
      strength of a material will be the determining factor in the
      source. The transformer, its voltage source,
      nd the associated
      design of the apparatus in which it is to be used.
      controls shall have the following capabilities:
      5.2 Tests made as specified herein may be used to provide
      6.1.1 The ratio of crest to root-mean-square (rms) test
      part of the information needed for determining suitability of a
      voltage shall be equal to =2 6 5% (1.34 to 1.48), with the
      materialforagivenapplication;andalso,fordetectingchanges
      test specimen in the circuit, at all voltages greater than 50 %of
      or deviations from normal characteristics resulting from pro-
      the breakdown voltage.
      cessing variables, aging conditions, or other manufacturing or
      6.1.2 The capacity of the source shall be sufficient to
      maintainthetestvoltageuntildielectricbreakdownoccurs.For
      most materials, using electrodes similar to those shown in
      6 Table 1, an output current capacity of 40 mA is usually
      Available fromAmerican National Standards Institute (ANSI), 25 W.43rd St.,
      4th Floor, New York, NY 10036. satisfactory. For more complexelectrode structures, or for

      電壓擊穿試驗(yàn)儀美標(biāo)標(biāo)準(zhǔn)ASTM D149
      D 149 –
      97a (2004)
      A
      TABLE 1 Typical Electrodes for Dielectric Strength Testing ofVarious Types of Insulating Materials
      Electrode
      B,C
      Description of Electrodes Insulating Materials
      Type
      1 Opposing cylinders
      51mm (2 in.) in diameter, 25 mm (1 in.) thick with flat sheets of paper, films, fabrics, rubber, molded plastics, laminates,
      edges rounded to
      6.4mm (0.25 in
      .) radius boards, glass, mica, nd ceramic
      2 Opposing cylinders
      25 mm (1 in.) in diameter, 25 mm (1 in.) thick with same as for Type 1, particularly for glass, mica, plastic,nd ceramic
      edges rounded to
      3.2 mm (0.125 in.) radius
      3 Opposing cylindrical rods
      6.4 mm (0.25in
      .) in diameter with edges same as for Type 1, particularly for varnish, plastic,nd other thin film and
      D
      rounded to
      0.8 mm (0.0313 in.) radius tapes: where small specimens necessitate the use of smaller electrodes,
      or where testing of a small area is desired
      4 Flat plates
      6.4 mm(0.25 in
      .) widend 108 mm (4.25 in
      .) long with edges same as for Type 1, particularly for rubber tapesnd other narrow widths
      square
      nd endsrounded to
      3.2 mm (0.125 in.) radius of thin materials
      E
      5 Hemispherical electrodes
      12.7 mm (0.5in
      .) in diameter fillingnd treating compounds, gelsnd semisolid compoundsnd greases,
      embedding, potting,
      nd encapsulating materials
      6 Opposing cylinders; the lower one
      75 mm (3 in.) in diameter, 15 mmsame as for Types 1nd 2
      (
      0.60 in.) thick; the upper one 25 mm (1 in.) in diameter, 25 mm
      F
      thick; with edges of both rounded to
      3 mm (0.12in.) radius
      G
      7 Opposing circular flat plates,
      150 mm diameter , 10 mm thick with flat sheet, plate, or boardmaterials, for tests with the voltage gradient
      H
      edges rounded to 3 to
      5mm
      radius parallel to the surface
      A
      TheseelectrodesarethosemostcommonlyspecifiedorreferencedinASTMstandards.WiththeexceptionofType5electrodes,noattempthasbeenmadetosuggest
      electrode systems for other than flat surface material. Otherelectrodes may be used as specified in ASTM standards or as agreedupon between seller
      nd purchaser
      where none of these electrodes in the table is suitable for properevaluation of the material being tested.
      B
      Electrodes are normally made from either brass or stainless steel.Reference should be made to the standard governing the material tobe tested to determine which,
      if either, material is preferable.
      C
      The electrodes surfaces should be polished
      nd free fromirregularities resulting from previous testing.
      D
      Refer to the appropriate standard for the load force applied by theupper electrode assembly. Unless otherwise specified the upperelectrodes shall be 50 6
      2g.
      E
      Refer to the appropriate standard for the proper gap settings.
      F
      The Type 6 electrodes are those given in IEC Publication 243-1 fortesting of flat sheet materials. They are less critical as toconcentricity of the electrodes than are
      the Types 1
      nd 2electrodes.
      G
      Other diameters may be used, provided that all parts of the testspecimen are at least
      15mminside the edges of the electrodes.
      H G
      The Type 7 electrodes, as described in the table
      nd in Note , are thosegiven in IEC Publication 243-1 for making tests parallel to thesurface.
      電壓擊穿試驗(yàn)儀美標(biāo)標(biāo)準(zhǔn)ASTM D149
      testing high-loss materials, higher current capacity may be onecurrent setting. The electrode area may have a significant
      needed.Thepowerratingformosttestswillvaryfrom0.5kVA effect uponwhat the current setting should be.
      for testing low-capacitance specimens at voltages up to 10kV,
      6.1.7Thespecimen current-sensing element may be in the
      to 5 kVA for voltages up to 100 kV. primary of the step-uptransformer. Calibrate the current-
      6.1.3 The controls on the variable low-voltage source shall sensingdial in terms of specimen current.
      be capable of varying the supply voltage
      nd the resultant test 6.1.8 Exercise care in setting the response of the current
      voltage smoothly, uniformly,
      nd without overshoots or tran- control. Ifthe control is set too high, the circuit will not
      sients, in accordance with 12.2. Do not allow the peak voltagerespondwhenbreakdownoccurs;ifsettoolow,itmayrespond
      to exceed 1.48 times the indicated rms test voltage under any toleakage currents, capacitive currents, or partial discharge
      circumstance. Motor-driven controls are preferable for making(corona)currentsor,whenthesensingelementislocatedinthe
      short-time (see 12.2.1) or slow-rate-of-rise (see 12.2.3) tests.primary, to the step-up transformer magnetizing current.
      6.1.4 Equip the voltage source with a circuit-breaking 6.2 VoltageMeasurement—A voltmeter must be provided
      device that will operate within three cycles. The device shall formeasuring the rms test voltage. A peak-reading voltmeter
      disconnect the voltage-source equipment from the power may be used,in which case divide the reading by =2toget
      service
      ndprotect it from overload as a result of specimen rms values. Theoverall error of the voltage-measuring circuit
      breakdown causing an overload of the testing apparatus. If shallnot exceed 5 % of the measured value. In addition, the
      prolonged current follows breakdown it will result in unnec-response time of the voltmeter shall be such that its time lag
      essary burning of the test specimens, pitting of the electrodes,will not be greater than 1% of full scale at any rate-of-rise
      and contamination of any liquid surrounding medium. used.
      6.1.5 The circuit-breaking device should have an adjustable 6.2.1Measure the voltage using a voltmeter or potential
      current-sensing element in the step-up transformer secondary,transformer connected to the specimen electrodes, or to a
      to allow for adjustment consistent with the specimen charac-separate voltmeter winding, on the test transformer, that is
      teristics
      ndarranged to sense specimen current. Set the unaffected by thestep-up transformer loading.
      sensing element to respond to a current that is indicative of 6.2.2It is desirable for the reading of the maximum applied
      specimen breakdown as defined in 12.3. test voltage to be retainedon the voltmeter after breakdown so
      6.1.6 The current setting can have a significant effect on the thatthe breakdown voltage can be accurately read
      nd re-
      test results. Make the setting high enough that transients, suchcorded.
      as partial discharges, will not trip the breaker but not so high6.3 Electrodes—For a given specimen configuration, the
      thatexcessiveburningofthespecimen,withresultantelectrode dielectricbreakdown voltage may vary considerably, depend-
      damage, will occur on breakdown. The optimum currentinguponthegeometryandplacementofthetestelectrodes.For
      setting is not the same for all specimens
      nd depending upon this reason it is important that the electrodes to be used be
      the intended use of the material
      nd thepurpose of the test, it described when specifying this testmethod,
      nd thatthey be
      may be desirable to make tests on a given sample at more thandescribed in the report.

      電壓擊穿試驗(yàn)儀美標(biāo)標(biāo)準(zhǔn)ASTM D149
      D 149 –
      97a (2004)
      6.3.1
      One of the electrodes listed inTable 1 should be the test values. Testing in air may requireexcessively large
      specified by the document referring to this test method. If nospecimens or cause heavy surface discharges
      nd burning
      electrodes have been specified,
      elect an applicable one from beforebreakdown. Some electrode systems for testing in air
      Table 1, or use other electrodes mutually acceptable to the makeuse of pressure gaskets around the electrodes to prevent
      parties concerned when the standard electrodes cannot be usedflashover. The material of the gaskets or seals around the
      due to the nature or configuration of the material being tested.electrodes may influence the breakdown values.
      See references in Appendix X2 for examples of some special 6.4.1When tests are made in insulating oil, an oil bath of
      electrodes.Inanyeventtheelectrodesmustbedescribedinthe adequatesize shall be provided. (Caution—The use of glass
      report. containers is not recommended for tests at voltagesabove
      6.3.2 The electrodes of Types 1 through 4
      nd Type 6 of about10kV,becausetheenergyreleasedatbreakdownmaybe
      Table 1 should be in contact with the test specimen over thesufficient to shatter the container. Metal baths must be
      entire flat area of the electrodes. grounded.)
      6.3.3 The specimens tested using Type 7 electrodes should It isrecommended that mineral oil meeting the requirements
      be of such size that all portions of the specimen will be within ofSpecification D 3487, Type I or II, be used. It should have a
      andnolessthan15mmfromtheedgesoftheelectrodesduring dielectricbreakdown voltage as determined by Test Method
      test. In most cases, tests usingType 7 electrodes are made with D877 of at least 26 kV. Other dielectric fluids may be used as
      the plane of the electrode surfaces in a vertical position. Testssurrounding mediums if specified. These include, but are not
      made with horizontal electrodes should not be directly com- limitedto, silicone fluids
      nd other liquids intended for use in
      pared with tests made with vertical electrodes, particularlytransformers, circuit breakers, capacitors, or cables.
      when the tests are made in a liquid surrounding medium.
      6.4.1.1 The quality of the insulating oil may have an
      6.3.4 Keep the electrode surfaces clean
      nd smooth,
      nd appreciable effect upon the test results. In addition tothe
      freefromprojectingirregularitiesresultingfromprevioustests.dielectric breakdown voltage, mentioned above, particulate
      If asperities have developed, they must be removed. contaminantsare especially important when very thin speci-
      6.3.5 It is important that the original manufacture
      nd mens (25 μm (1 mil)or less) are being tested. Depending upon
      subsequent resurfacing of electrodes be done in such a manner thenature of the oil
      nd the properties of the material being
      that the specified shape
      nd finish ofthe electrodes
      ndtheir tested, other properties, including dissolved gas content,water
      edges are maintained. The flatness
      ndsurface finish of the content,
      nd dissipation factor of the oil may alsohave an
      electrode faces must be such that the faces are in close contacteffect upon the results. Frequent replacement of the oil, orthe
      with the test specimen over the entire area of the electrodes. useof filters
      ndother reconditioning equipment may be
      Surface finish is particularly important when testing very thinnecessary to minimize the effect of variations of the qualityof
      materials which are subject to physical damage from improp- the oilon the test results.
      erly finished electrodes. When resurfacing, do not change the6.4.1.2 Breakdown values obtained using liquids having
      transition between the electrode face
      nd any specified edge different electrical properties may not be comparable. (See
      radius. X1.4.7.)Iftestsaretobemadeatotherthanroomtemperature,
      6.3.6 Whenever the electrodes are dissimilar in size or the bathmust be provided with a means for heating or cooling
      shape, the one at which the lowest concentration of stress theliquid,
      nd with ameans to ensure uniform temperature.
      exists, usually the larger in size
      nd with the largest radius, Small baths canin some cases be placed in an oven (see 6.4.2)
      should be at ground potential. in order to provide temperaturecontrol. If forced circulation of
      6.
      3.7Insome special cases liquid metal electrodes, foil the fluid is provided, care must be taken to prevent bubbles
      electrodes, metal shot, water, or conductive coating electrodesfrom being whipped into the fluid. The temperature shall be
      are used. It must be recognized that these may give resultsmaintainedwithin65°Cofthespecifiedtesttemperatureatthe
      differing widely from those obtained with other types ofelectrodes, unless otherwise specified. In many cases it is
      electrodes. specified that specimens to be tested in insulating oilare to be
      6.3.8 Because of the effect of the electrodes on the testpreviously impregnated with the oil
      nd not removed from the
      results, it is frequently possible to obtain additional informa-oilbeforetesting(seePracticeD2413).Forsuchmaterials,the
      tion as to the dielectric properties of a material (or a group ofbath must be of such design that it will not be necessary to
      materials) by running tests with more than one type of expose thespecimens to air before testing.
      electrode. This technique is of particular value for research 6.4.2If tests in air are to be made at other than ambient
      testing. temperature or humidity, an oven or controlledhumidity
      6.4 Surrounding Medium—The document calling for this chamber mustbe provided for the tests. Ovens meeting the
      test method should specify the surrounding medium
      nd therequirementsofSpecificationD 5423andprovidedwithmeans
      test temperature. Since flashover must be avoided
      nd the for introducingthe test voltage will be suitable for use when
      effects of partial discharges prior to breakdown mimimized, onlytemperature is to be controlled.
      even for short time tests, it is often preferable
      nd sometimes 6.4.3Testsingassesotherthanairwillgenerallyrequirethe
      necessary to make the tests in insulating liquid (see 6.4.1). useof chambers that can be evacuated
      nd filled with the test
      Breakdown values obtained in insulating liquid may not be gas,usually under some controlled pressure. The design of
      comparable with those obtained in air. The nature of the suchchambers will be determined by the nature of the test
      insulating liquid
      nd the degree ofprevious use may influence program to beundertaken.

      電壓擊穿試驗(yàn)儀美標(biāo)標(biāo)準(zhǔn)ASTM D149
      D 149 –
      97a(2004)
      6.5 Test Chamber—The test chamber or area in which the 8.2 Samplingprocedures for quality control purposes
      tests are to be made shall be of sufficient size to hold the testshould provide for gathering of sufficient samples to estimate
      equipment,
      nd shall be provided with interlocks to prevent both the average qualitynd the variability of the lot being
      accidental contact with any electrically energized parts. Aexamined;
      nd forproper protection of the samples from the
      number of different physical arrangements of voltage source, timethey are taken until the preparation of the test specimens
      measuring equipment, baths or ovens,
      nd electrodes are in the laboratory or other test area is begun.
      possible, but it is essential that (1) all gates or doors providing8.3 For the purposes of most tests it is desirable to take
      access to spaces in which there are electrically energized partssamples from areas that are not immediately adjacent to
      be interlocked to shut off the voltage source when opened; ( 2)obvious defects or discontinuities in the material. The outer
      clearances are sufficiently large that the field in the area of thefew layers of roll material, the top sheets of a package of
      electrodes
      nd specimen are notdistorted
      nd thatflashovers sheets, or material immediately next to an edge of asheet or
      and partial discharges (corona) do not occur except between rollshould be avoided, unless the presence or proximity of
      the test electrodes;
      nd (3)insertion
      ndreplacement of defects or discontinuities is of interest in theinvestigation of
      specimens between tests be as simple
      nd convenient as the material.
      possible.Visualobservationoftheelectrodesandtestspecimen 8.4 Thesample should be large enough to permit making as
      during the test is frequently desirable. many individual tests asmay be required for the particular
      material (see 12.4).
      7. Hazards
      9. Test Specimens
      7.1 Warning—Lethal voltages may be present during this
      9.1 Preparation
      nd Handling:
      test. It is essential that the test apparatus,
      nd allassociated
      9.1.1Prepare specimens from samples collected in accor-
      equipment that may be electrically connected to it, be properly
      dance with Section 8.
      designed
      ndinstalled for safe operation. Solidly ground all
      9.1.2 When flat-faced electrodes are to be used, the surfaces
      electrically conductive parts that any person might come into
      of the specimens which will be in contact with the electrodes
      contact with during the test. Provide means for use at the
      shall be smooth parallel planes, insofar as possible without
      completion of any test to ground any parts which: were at high
      actual surface machining.
      voltage during the test; may have acquired an induced charge
      9.1.3 The specimens shall be of sufficient size to prevent
      duringthetest;mayretaina chargeeven after disconnection of
      flashover under the conditions of test. For thin materials itmay
      the voltage source. Thoroughly instruct all operators in the
      be convenient to use specimens large enough to permit making
      proper way to conduct tests safely. When making high-voltage
      more than one test on a single piece.
      tests, particularly in compressed gas or in oil, the energy
      9.1.4 For thicker materials (usually more than
      2 mmthick)
      released at breakdown may be sufficient to result in fire,
      the breakdown strength may be high enough that flashover or
      explosion, or rupture of the test chamber. Design test equip-
      intense surface partial discharges (corona) may occur prior to
      ment, test chambers,
      nd test specimens so as to minimize the
      breakdown. Techniques that may be used to prevent flashover,
      possibility of such occurrences
      nd to eliminate the possibility
      or to reduce partial discharge (corona) include:
      of personal injury.
      電壓擊穿試驗(yàn)儀美標(biāo)標(biāo)準(zhǔn)ASTM D149

      9.1.4.1 Immerse the specimen in insulating oil during the
      7.2 Warning—Ozone is a physiologically hazardous gas at
      test. See X1.4.7 for the surrounding medium factors influenc-
      elevated concentrations. The exposure limits are set by gov-
      ingbreakdown.Thismaybenecessaryforspecimensthathave
      ernmental agencies
      nd are usually based upon recommenda-
      not been dried
      ndimpregnated with oil, as well as for those
      tions made by the American Conference of Governmental
      7
      whichhavebeenpreparedinaccordancewithPracticeD 2413,
      Industrial Hygienists. Ozone is likely to be present whenever
      for example. (See 6.4.)
      voltagesexistwhicharesufficienttocausepartial,orcomplete,
      9.1.4.2 Machinearecessordrillaflat-bottomholeinoneor
      discharges in air or other atmospheres that contain oxygen.
      both surfaces of the specimen to reduce the test thickness. If
      Ozone has a distinctive odor which is initially discernible at
      dissimilar electrodes are used (such as Type 6 of Table 1) and
      low concentrations but sustained inhalation of ozone can cause
      only one surface is to be machined, the larger of the two
      temporary loss of sensitivity to the scent of ozone. Because of
      electrodes should be in contact with the machined surface.
      thisitisimportanttomeasuretheconcentrationofozoneinthe
      Caremustbetakeninmachiningspecimensnottocontaminate
      atmosphere, using commercially available monitoring devices,
      or mechanically damage them.
      whenever the odor of ozone is persistently present or when
      9.1.4.3 Apply seals or shrouds around the electrodes, in
      ozone generating conditions continue. Use appropriate means,
      contact with the specimen to reduce the tendency to flashover.
      such as exhaust vents, to reduce ozone concentrations to
      9.1.5 Materials that are not in flat sheet form shall be tested
      acceptable levels in working areas.
      using specimens (and electrodes) appropriate to the material
      8. Sampling
      ndthe geometry of the sample. It is essential that for these
      materials both the specimen
      nd the electrodes be defined in
      8.1 The detailed sampling procedure for the material being
      the specification for the material.
      tested should be defined in the specification for thatmaterial.
      9.1.6 Whatever the form of the material, if tests of other
      than surface-to-surface puncture strength are to be made,
      7 define the specimens
      nd the electrodes in the specification for
      Available from the American Conference of Governmental IndustrialHygien-
      ists, Building No. D-7, 6500 Glenway Ave., Cincinnati, OH 45211.the material.

      D 149 –97a (2004)
      9.2 In nearly all cases the actual thickness of thetest
      specimenisimportant.Unlessotherwisespecified,measurethe
      thickness after the test in the immediate vicinity of the areaof
      breakdown. Measurements shall be made at room temperature
      (25 6
      5°C), using the appropriate procedure of Test Methods
      D374.
      10. Calibration
      10.1In making calibrationmeasurements, take care that the
      valuesofvoltageattheelectrodescanbedeterminedwithinthe
      accuracy given in 6.2, with the test specimens in the circuit.Rates
      (V/s) 6 20 %
      10.2 Use an independently calibrated voltmeter attached to
      100
      the output of the test voltage source to verify the accuracy of200
      500
      the measuring device. Electrostatic voltmeters, voltage divid-
      1000
      ers,orpotentialtransformershavingcomparableaccuracymay
      2000
      be used for calibration measurement. 5000
      10.3 At voltages above about 12 kV rms (16.9 kV peak) a FIG. 1Voltage Profile of the Short-Time Test
      sphere gap may be used to calibrate the readings of the
      voltage-measuring device. Follow procedures as specified in
      ANSI C
      68.1 insuch calibration.
      occasionalaveragetimetobreakdownfallingoutsidetherange
      of 10 to 20 s. In this case, the times to failures shall bemade
      11. Conditioning
      a part of the report.
      電壓擊穿試驗(yàn)儀美標(biāo)標(biāo)準(zhǔn)ASTM D149

      11.1 The dielectric strength of most solid insulating mate-
      12.2.1
      .3 In running a series of testscomparing different
      rials is influenced by temperature
      nd moisture content. Mate- material, the same rate-of-rise shall be used with preference
      rials so affected should be brought to equilibrium with an given toa rate that allows the average time to be between 10
      atmosphere of controlled temperature
      ndrelative humidity
      nd 20 s. If the time to breakdown cannot be adhered to,the
      before testing. For such materials, the conditioning should be timeshall be made a part of the report.
      included in the standard referencing this test method. 12.2.2Method B, Step-by-Step Test—Apply voltage to the
      11.2 Unless otherwise specified, follow the procedures in testelectrodes at the preferred starting voltage
      nd in steps and
      Practice D618. duration as shown in Fig. 2 until breakdownoccurs.
      12.2.2.1 From the list in Fig. 2,
      elect the initial voltage, V ,
      11.3 For many materials the moisture content has more s
      to be the one closest to 50 % of the experimentally determined
      effect on dielectric strength than does temperature. Condition-
      or expected breakdown voltage under the short time test.
      ing times for these materials should be sufficiently long to
      12.2.2.2 If an initial voltage other than one of the preferred
      permit the specimens to reach moisture equilibrium as well as
      values listed in Fig. 2 is selected, it is recommended that the
      temperature equilibrium.
      voltage steps be 10% of the preferred initial voltage immedi-
      11.4 If the conditioning atmosphere is such that condensa-
      ately below the selected value.
      tionoccursonthesurfaceofthespecimens,itmaybedesirable
      12.2.2.3 Apply the initial voltage by increasing the voltage
      to wipe the surfaces of the specimens immediately before
      from zero as rapidly as can be accomplished without introduc-
      testing. This will usually reduce the probability of surface
      ing a peak voltage exceeding that permitted in 6.1.3. Similar
      flashover.
      requirements shall apply to the procedure used to increase the
      voltagebetweensuccessivesteps.Aftertheinitialstep,thetime
      12. Procedure
      required to raise the voltage to the succeeding step shall be
      12.1 (Caution—see Section 7 before commencement of
      counted as part of the time at the succeeding step.
      any test.)
      電壓擊穿試驗(yàn)儀美標(biāo)標(biāo)準(zhǔn)ASTM D149

      12.2.2.4 If breakdown occurs while the voltage is being
      12.2 Methods of Voltage Application:
      increased to the next step, the specimen is described as having
      12.2.1 Method A, Short-Time Test—Apply voltage uni- sustained adielectric withstand voltage, V , equal to the
      ws
      formlytothetestelectrodesfromzeroatoneoftheratesshown voltage ofthe step just ended. If breakdown occurs prior to the
      inFig.1untilbreakdownoccurs.Usetheshort-timetestunless end of theholding period at any step, the dielectric withstand
      otherwise specified. voltage,V,forthespecimenistakenasthevoltageatthelast
      ws
      12.2.1.1 When establishing a rate initially in order for it tocompletedstep.Thevoltageatbreakdown,V ,istobeusedto
      bd
      beincludedinanewspecification,selectaratethat,foragiven calculatedielectric breakdown strength. The dielectric with-
      set of specimens, will give an average time to breakdown of standstrength is to be calculated from the thickness
      nd the
      between 10
      nd 20s. It may be necessary to run one or two dielectric withstandvoltage, V . (See Fig. 2.)
      ws
      preliminary tests in order to determine the most suitable 12.2.2.5It is desirable that breakdown occur in four to ten
      rate-of-rise. For many materials a rate of 500 V/s is used. steps,but in not less than 120 s. If failure occurs at the third
      12.2.1.2 If the document referencing this test method speci-steporless,orinlessthan120s,whicheverisgreater,onmore
      fied a rate-of-rise, it shall be used consistently in spite ofthanonespecimeninagroup,thetestsshouldberepeatedwith
      6

      電壓擊穿試驗(yàn)儀美標(biāo)標(biāo)準(zhǔn)ASTM D149
      D 149 –
      97a(2004)
      Rates (V/s) 6 20 % Constraints
      1 tbd > 120 s
      2
      5
      Preferred starting voltages, V are 0.25, 0.50, 1, 2, 5, 10, 20,50,
      nd 100 kV.
      s
      10 Vbd = > 1.5 Vs
      Step Voltage 12.5
      when Increment
      20
      A
      Vs(kV) is (kV) 25
      50
      5 or less 10 % of Vs
      100
      over 5 to 10 0.50
      over 10 to 25 1 FIG. 3 Voltage Profile of Slow Rate-of-RiseTest
      over 25 to 50 2
      over 50 to 100 5
      over 100 10
      greater than 2.5 times the initial value (and at a time of over
      A
      Vs = 0.5 ( Vbd for Short-Time Test) unless constraints cannot bemet.
      ________________________________________________________________120 s), increase the initial voltage.
      Constraints
      12.3 Criteria of Breakdown—Dielectric failure or dielectric
      (t 1 - t0)=(t2 - t1) = ... = (60 6 5)s
      Alternate step times, (20 6 3)s
      nd (300 6 10)sbreakdown (as defined in Terminology D 1711) consists of an
      120s # t # 720s, for 60s steps
      bd increase in conductance, limiting the electric field that canbe
      ________________________________________________________________
      sustained. This phenomenon is most commonly evidenced
      FIG. 2 Voltage Profile of Step-by-Step Test
      duringthetestbyanabruptvisibleandaudiblerupturethrough
      the thickness of the specimen, resulting in a visible puncture
      a lower initial voltage. If failure does not occur beforethe
      nddecomposition of the specimen in the breakdown area.
      twelfth step or greater than 720 s, increase the initial voltage.This form of breakdown is generally irreversible.Repeated
      12.2.2.6 Recordthe initial voltage, the voltage steps, theapplicationsofvoltagewillsometimesresultinfailureatlower
      breakdown voltage,
      nd the length of time that the breakdown
      voltages (sometimes unmeasurably low), usually with addi-
      voltage was held. If failure occurred while the voltage was
      tional damage at the breakdown area. Such repeated applica-
      being increased to the starting voltage the failure time shallbe
      tions of voltage may be used to give positive evidence of
      zero.
      breakdown
      nd tomake the breakdown path more visible.
      12.2.2.7 Other time lengths for the voltage steps may be
      12.3.1 Arapid rise in leakage current may result in tripping
      specified, depending upon the purpose of the test. Commonly
      of the voltage source without visible decomposition of the
      used lengths are 20 s
      nd 300 s (5 min). For research purposes,
      specimen. This type of failure, usually associated with slow-
      it may be of value to conduct tests using more than one time
      rise tests at elevated temperatures, may in some cases be
      interval on a given material.
      reversible,thatis,recoveryofthedielectricstrengthmayoccur
      12.2.3 Method C, Slow Rate-of-Rise Test—Apply voltage to
      the test electrodes, from the starting voltage
      nd at the rate if thespecimen is allowed to cool to its original test tempera-
      shown in Fig. 3 until breakdown occurs. ture before reapplyingvoltage. The voltage source must trip
      12.2.3.1 Selecttheinitialvoltagefromshort-timetestsmaderapidlyatrelativelylowcurrentforthistypeoffailuretooccur.
      as specified in 12.2.1. The initial voltage shall be reached as12.3.2 Tripping of the voltage source may occur due to
      specified in 12.2.2.3.
      flashover, to partial discharge current, to reactive current ina
      12.2.3.2 Use the rate-of-voltage rise from the initial value
      highcapacitancespecimen,ortomalfunctioningofthebreaker.
      specified in the document calling for this test method. Ordi-
      Such interruptions of the test do not constitute breakdown
      narily the rate is selected to approximate the average rate fora
      (except for flashover tests)
      nd should not be considered as a
      step-by-step test.
      satisfactory test.
      12.2.3.3 Ifmorethanonespecimenofagroupofspecimens
      12.3.3 If the breaker is set for too high a current, or if the
      breaks down in less than 120 s, reduce either the initialvoltage
      breaker malfunctions, excessive burning of the specimen will
      or the rate-of-rise, or both.
      occur.
      12.2.3.4 Ifmorethanonespecimenofagroupofspecimens
      breaks down at less than 1.5 times the initial voltage, reduce 12.4Number of Tests—Make five breakdowns unless oth-
      the initial value. If breakdown repeatedly occurs at a value erwisespecified for the particular material.

      電壓擊穿試驗(yàn)儀美標(biāo)標(biāo)準(zhǔn)ASTM D149
      D 149 –
      97a(2004)
      13. Calculation 15. Precision
      nd Bias
      13.1 CalculateforeachtestthedielectricstrengthinkV/mm 15.1 Theresults of an interlaboratory study with four
      or V/mil at breakdown,
      nd forstep-by-step tests, the gradient laboratories
      nd eight materials aresummarized in Table 2.
      at the highest voltage step at which breakdown did not occur. Thisstudy made use of one electrode system
      nd one test
      8
      13.2 Calculate the average dielectric strength
      nd the stan- medium.
      dard deviation, or other measure of variability. 15.2Single-Operator Precision—Depending upon the vari-
      ability of the material being tested, the specimen thickness,
      14. Report
      method of voltage application,
      nd the extent to which tran-
      14.1 Report the following information: sient voltage surges arecontrolled or suppressed, thecoeffi-
      14.1.1Identification of the test sample. cientofvariation(standarddeviationdividedbythemean)may
      14.1.2 For Each Specimen: varyfromalow1%toashighas20%ormore.Whenmaking
      14.1.2.1 Measured thickness, duplicate tests on five specimens fromthe same sample, the
      14.1.2.2 Maximum voltage withstood (for step-by-step coefficient ofvariation usually is less than 9 %.
      tests), 15.3 Multilaboratory Precision—The precision of tests
      14.1.2.3 Dielectric breakdown voltage, made in differentlaboratories (or of tests made using different
      14.1.2.4 Dielectric strength (for step-by-step tests), equipment inthe same laboratory) is variable. Using identical
      14.1.2.5 Dielectric breakdown strength, and
      A
      TABLE 2 Dielectric Strength Data Summary From Four Laboratories
      Dielectric Strength (V/mil)
      Thickness Standard Coefficient of
      Material
      (in. nom.) Deviation Variation (%)
      mean max min
      Polyethylene 0.001 4606 5330 4100 332 7.2
      Terephthalate
      Polyethylene 0.01 1558 1888 1169 196 12.6
      Terephthalate
      Fluorinated 0.003 3276 3769 2167 333 10.2
      Ethylene
      Propylene
      Fluorinated 0.005 2530 3040 2140 231 9.1
      Ethylene
      Propylene
      PETP fiber 0.025 956 1071 783 89 9.3
      reinforced
      epoxy resin
      PETP fiber 0.060 583 643 494 46 7.9
      reinforced
      epoxy resin
      Epoxy-Glass 0.065 567 635 489 43 7.6
      Laminate
      Crosslinked 0.044 861 948 729 48 5.6
      Polyethylene
      Average
      8.7
      A
      電壓擊穿試驗(yàn)儀美標(biāo)標(biāo)準(zhǔn)ASTM D149

      Tests performed with specimens in oil using Type 2 electrodes (seeTable 1).
      14.1.2.6 Location of failure (center of electrode, edge, or typesof equipment
      nd controlling specimen preparation,
      outside). electrodes
      nd testing procedures closely, the single-operator
      14.1.3 For Each Sample: precision is approachable. When making adirect comparison
      14.1.3.1 Average dielectric withstand strength for step-by-ofresultsfromtwoormorelaboratories,evaluatetheprecision
      step test specimens only, between the laboratories.
      14.1.3.2 Average dielectric breakdown strength,
      15.4 If the material under test, the specimen thickness, the
      14.1.3.3 Indication of variability, preferably the standard
      electrode configuration, or the surrounding medium differs
      deviation
      ndcoefficient of variation,
      from those listed in Table 1, or if the failure criterion ofthe
      14.1.3.4 Description of test specimens,
      current-sensing element of the test equipment is not closely
      14.1.3.5 Conditioning
      nd specimen preparation,
      controlled, the precisions cited in 15.2
      nd 15.3 may not be
      14.1.3.6 Ambient atmosphere temperature
      nd relative hu-
      realized. Standards which refer to this method should deter-
      midity,
      mineforthematerialwithwhichthatstandardisconcernedthe
      14.1.3.7 Surrounding medium,
      applicability of this precision statement to that particular
      14.1.3.8 Test temperature,
      material. Refer to 5.4-5.8
      nd 6.1.6.
      14.1.3.9 Description of electrodes,
      14.1.3.10 Method of voltage application,
      14.1.3.11 If specified, the failure criterion of the current-
      sensing element,
      nd 8
      The complete report is available from ASTM International. RequestRR:D09-
      14.1.3.12 Date of test. 1026.

      電壓擊穿試驗(yàn)儀美標(biāo)標(biāo)準(zhǔn)ASTM D149
      D 149 –
      97a(2004)
      15.5 Use special techniques
      nd equipment for materials 16. Keywords
      having a thickness of
      0.001 in. or less.The electrodes must not
      16.1 breakdown; breakdown voltage; calibration; criteria of
      damage the specimen upon contact. Accurately determine the
      breakdown; dielectric breakdown voltage; dielectric failure;
      voltage at breakdown.
      dielectric strength; electrodes; flashover; power frequency;
      15.6 Bias—This test method does not determine the intrin-
      process-control testing; proof testing; quality-controltesting;
      sic dielectric strength. The test values are dependent upon
      rapid rise; research testing; sampling; slow rate-of-rise;step-
      specimen geometry, electrodes,
      nd other variable factors, in
      by-step; surrounding medium; voltage withstand
      addition to the properties of the sample, so that it is not
      possible to make a statement of bias.
      APPENDIXES
      (Nonmandatory Information)
      X1. SIGNIFICANCE OF THE DIELECTRIC STRENGTH TEST
      X1.1 Introduction directly between the electrodes. Weak spotswithin the volume
      under stress sometimes determine the test results.
      X
      1.1.1 Abrief review of three postulated mechanisms of
      breakdown, namely: (1) the discharge or corona mechanism,
      X1.4 Influence of Test
      nd Specimen Conditions
      (2)thethermalmechanism,and(3)theintrinsicmechanism,as
      well as a discussion of the principal factors affecting testson
      X1.4.1 Electrodes— In general, the breakdown voltage will
      practical dielectrics, are given here to aid in interpretingthe
      tend to decrease with increasing electrode area, this areaeffect
      data. The breakdown mechanisms usually operate in combina-
      being more pronounced with thin test specimens. Test results
      tionratherthansingly.Thefollowingdiscussionappliesonlyto
      are also affected by the electrode geometry. Results may be
      solid
      ndsemisolid materials.
      affected also by the material from which the electrodes are
      constructed, since the thermal
      nd discharge mechanism may
      X1.2 Postulated Mechanisms of Dielectric Breakdown
      be influenced by the thermal conductivity
      nd the work
      X1.2.1 Breakdown Caused by Electrical Discharges—In function,respectively, of the electrode material. Generally
      many tests on commercial materials, breakdown is caused byspeaking, the effect of the electrode material is difficult to
      electrical discharges, which produce high local fields. With
      establish because of the scatter of experimental data.
      solid materials the discharges usually occur in the surrounding
      X1.4.2 Specimen Thickness—The dielectric strength of
      medium, thus increasing the test area
      nd producing failure at
      solid commercial electrical insulating materials is greatly
      or beyond the electrode edge. Discharges may occur in any
      dependentuponthespecimenthickness.Experiencehasshown
      internal voids or bubbles that are present or may develop.
      that for solid
      ndsemi-solid materials, the dielectric strength
      These may cause local erosion or chemical decomposition.
      varies inversely as a fractional power of the specimen thick-
      These processes may continue until a complete failure path is
      ness,
      nd there isa substantial amount of evidence that for
      formed between the electrodes.
      relatively homogeneous solids, the dielectric strength varies
      X1.2.2 Thermal Breakdown—Cumulative heating develops
      approximately as the reciprocal of the square root of the
      inlocalpathswithinmanymaterialswhentheyaresubjectedto
      thickness. In the case of solids that can be melted
      nd poured
      high electric field intensities, causing dielectric
      nd ionic
      to solidify between fixed electrodes, the effect of electrode
      conduction losses which generate heat more rapidly than can
      separationislessclearlydefined.Sincetheelectrodeseparation
      be dissipated. Breakdown may then occur because of thermal
      can be fixed at will in such cases, it is customary to perform
      instability of the material.
      dielectricstrengthtestsonliquidsandusuallyonfusiblesolids,
      X1.2.3 Intrinsic Breakdown—If electric discharges or ther-
      with electrodes having a standardized fixed spacing. Since the
      mal instability do not cause failure, breakdown will stilloccur
      when the field intensity becomes sufficient to accelerate elec-dielectric strength is so dependent upon thickness it is mean-
      trons through the material. This critical field intensity is calledingless to report dielectric strength data for a materialwithout
      the intrinsic dielectric strength. It cannot be determined by thisstating the thickness of the test specimens used.
      test method, although the mechanism itself may be involved. X1.4.3Temperature—The temperature of the test specimen
      and its surrounding medium influence the dielectric strength,
      X1.3 Nature of Electrical Insulating Materials although for mostmaterials small variations of ambient tem-
      X1.3.1 Solid commercial electrical insulating materials areperature may have a negligible effect. In general, thedielectric
      generally nonhomogeneous
      nd may contain dielectric defects strength will decrease with increasing temperatures, but the
      of various kinds. Dielectric breakdown often occurs in an areaextent to which this is true depends upon the material under
      of the test specimen other than that where the field intensity istest. When it is known that a material will be required to
      greatest
      nd sometimes in an area remotefrom the material function at other than normal room temperature,it is essential

      D 149 –97a (2004)
      that the dielectric strength-temperature relationship for theproperties are usually such that edge breakdown will generally
      material be determined over the range of expected operating occurif the electric strength, E , approaches the value given
      s
      temperatures. by:
      X
      1.4.4
      Time—Test results will beinfluenced by the rate of
      4.2 63
      E kV/mm (X1.4)
      voltage application. In general, the breakdown voltage will s 5 Sts1e8sD
      tend to increase with increasing rate of voltage application.
      In cases of large thickness of specimen
      nd low permittivity
      This is to be expected because the thermal breakdown mecha-
      of specimen, the term containing t becomes relatively insig-
      s
      nismistime-dependentandthedischargemechanismisusually
      nificant
      nd the product ofpermittivity
      ndelectric strength is
      time-dependent, although in some cases the latter mechanism 10
      approximately a constant. Whitehead also mentions (p. 261)
      may cause rapid failure by producing critically high localfield
      that the use of moist semiconducting oil can affect an appre-
      intensitives.
      ciablereductioninedgedischarges.Unlessthebreakdownpath
      X1.4.5 Wave Form—In general, the dielectric strength is
      between the electrodes is solely within the solid, results inone
      influenced by the wave form of the applied voltage.Within the
      medium cannot be compared with those in a different medium.
      limitsspecifiedinthismethodtheinfluenceofwaveformisnot
      It should also be noted that if the solid is porous or capableof
      significant.
      being permeated by the immersion medium, the breakdown
      X1.4.6 Frequency—The dielectric strength is not signifi-
      strength of the solid is directly affected by the electrical
      cantly influenced by frequency variations within the range of
      properties of immersion medium.
      commercial power frequencies provided for in this method.
      X1.4.8 Relative Humidity—The relative humidity influ-
      However, inferences concerning dielectric strength behavior at
      ences the dielectric strength to the extent that moisture ab-
      other than commercial power frequencies (50 to 60 Hz) must
      sorbed by, or on the surface of, the material under testaffects
      not be made from results obtained by this method.
      the dielectric loss
      nd surface conductivity. Hence, its impor-
      X1.4.7 Surrounding Medium—Solid insulating materials
      tance will depend to a large extent upon the nature of the
      havingahighbreakdownvoltageareusuallytestedbyimmers-
      material being tested. However, even materials that absorb
      ing the test specimens in a liquid dielectric such astransformer
      little or no moisture may be affected because of greatly
      oil, silicone oil, or chlorofluorocarbons, in order to minimize
      increased chemical effects of discharge in the presence of
      theeffectsofsurfacedischargespriortobreakdown.Ithasbeen
      9 moisture. Except in cases where the effect of exposure on
      shownbyS.Whitehead thatinordertoavoiddischargesinthe
      dielectric strength is being investigated, it is customary to
      surrounding medium prior to reaching the breakdown voltage
      control or limit the relative humidity effects by standard
      of the solid test specimen, in alternating voltage tests it is
      conditioning procedures.
      necessary that
      2 2 X1.5 Evaluation
      E D 1 E D 1 (X1.1)
      me
      8m = m 1 . se8s = s 1
      X1.
      5.1 A fundamental requirement of the insulation in
      If the liquid immersion medium is a low loss material, theelectrical apparatus is that it withstand the voltage imposedon
      criterion simplifies to it in service. Therefore there is a greatneed for a test to
      evaluatetheperformanceofparticularmaterialsathighvoltage
      2
      E E D 1 (X1.2)
      me
      8m . se8s = s 1 stress. The dielectric breakdown voltage test represents a
      and if the liquid immersion medium is a semiconducting convenientpreliminary test to determine whether a material
      material the criterion becomes merits further consideration, but itfalls short of a complete
      evaluation in two important respects. First, the condition of a
      E
      2f
      E (X1.3)
      msm . p er e0 s
      material as installed in apparatus is much different from its
      condition in this test, particularly with regard to theconfigu-
      where: ration of the electric field
      nd the area of material exposed to
      E = electric strength,
      it, corona, mechanical stress, ambient medium,
      nd association
      f = frequency,
      with other materials. Second, in service there aredeteriorating
      e
      nd e8 =permittivity,
      influences, heat, mechanical stress, corona
      nd its products,
      D = dissipation factor, and
      contaminants,
      ndso forth, which may reduce the breakdown
      s = conductivity (S/m).
      voltage far below its value as originally installed. Some of
      Subscripts:
      these effects can be incorporated in laboratory tests,
      nd a
      m refers to immersion medium,
      better estimate of the material will result, but the final
      r refers to relative,
      consideration must always be that of the performance of the
      0 refers to free space,
      -12 material in actual service.
      (e0 =
      8.854310F/m) and
      X1.5.2 The dielectric breakdown test may be used as a
      s refers to solid dielectric.
      material inspection or quality control test, as a means of
      X1.4.7.1 Whitehead points out that it is therefore desirable
      to increase E
      nd,or , if surface discharges are to be
      m em sm
      avoided. Transformer oil is usually specified
      nd its dielectric 10
      Starr, R. W., “Dielectric Materials Ionization Study" InterimEngineering,
      Report No. 5, Index No ME-111273.Available from Naval Sea SystemsCommand
      Technical Library, Code SEA 09B 312, National Center 3, Washington,DC
      9
      Whitehead, S., Dielectric Breakdown of Solids, Oxford UniversityPress, 1951. 20362-5101.

      電壓擊穿試驗(yàn)儀美標(biāo)標(biāo)準(zhǔn)ASTM D149
      D 149 –
      97a (2004)
      inferring other conditions such as variability, or to indicate thetest it is the relative value of the breakdown voltage that is
      deteriorating processes such as thermal aging. In these uses ofimportant rather than the absolute value.
      X2. STANDARDS REFERRING TO TEST METHOD D149
      X2.1 Introduction X
      2.1.2 In some standards which specify that thedielectric
      strength or the breakdown voltage is to be determined in
      X2.1.1 The listing of documents in this appendix provides
      reference to a broad range ofASTM standards concerned withaccordance with Test Method D 149, the manner in which the
      determination of dielectric strength at power frequencies orreference is made to this test method is not completely in
      with elements of test equipment or elements of proceduralconformance with the requirements of 5.5. Do not use another
      details used to determine this property. While every effort hasdocument, including those listed in this appendix, as a model
      been made to include as many as possible of the standardsforreferencetothistestmethodunlessthereisconformitywith
      referring to Test Method D 149, the list may not be complete,5.5.
      and standards written or revised after publication of this
      appendix are not included.

       

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